Computational tools and test techniques are pivotal in developing high-reliable semiconductor materials. These tools predict material properties under various conditions, ensuring reliability. They include quantum mechanics simulations for material behavior prediction and finite element analysis for stress and thermal management. Test techniques like accelerated life testing and environmental stress testing validate reliability under extreme conditions.
Recent advancements include:
Shiromani Balmukund Rahi, Young Suh Song, Laxman Raju Thoutam, T. S. Arun Samuel, Shubam Tayal